Second order correction in linearized proximity probe
US4228392A · kind A · utility
6Cited by
10References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 11, 1977 |
| Grant date | Oct 14, 1980 |
| Priority date | — |
| Expiry date | Oct 11, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for reducing higher order nonlinearities in the linearized output of a dimension gauging probe in which the dimension gauging probe provides an output varying inversely with the physical dimension gauged which is in turn linearized to a signal varying proportionally with the physical dimension. Higher order nonlinearities, an error condition, which deviate the correspondence between the gauged dimension and the output from a linear or straight-line function, are reduced by feedback of the linearized output to the probe and, preferably, by feedforward of a portion of the probe output signal to the linearized signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.