Method of fabrication of semiconductor components having optoelectronic conversion properties
US4229237A · kind A · utility
6Cited by
7References
14Claims
0Family size
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Key dates
| Filing date | Oct 18, 1979 |
| Grant date | Oct 21, 1980 |
| Priority date | — |
| Expiry date | Oct 18, 1999 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/919
Abstract
The top surface of a wafer of p-type ZnTe semiconductor material is subjected to double diffusion of an acceptor impurity and of a donor impurity so as to create in the ZnTe on the one hand a compensated region having high resistivity and on the other hand a surface injection region of small thickness, a metallic contact being finally formed on each face of the wafer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.