Patent · US Expired

Method of fabrication of semiconductor components having optoelectronic conversion properties

US4229237A · kind A · utility

6Cited by
7References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 18, 1979
Grant dateOct 21, 1980
Priority date
Expiry dateOct 18, 1999

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/919

Abstract

The top surface of a wafer of p-type ZnTe semiconductor material is subjected to double diffusion of an acceptor impurity and of a donor impurity so as to create in the ZnTe on the one hand a compensated region having high resistivity and on the other hand a surface injection region of small thickness, a metallic contact being finally formed on each face of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.