Method of and apparatus for testing electronic circuit assemblies and the like
US4236246A · kind A · utility
28Cited by
7References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 3, 1978 |
| Grant date | Nov 25, 1980 |
| Priority date | — |
| Expiry date | Nov 3, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31924
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are disclosed for identifying and locating faults in the portion of circuit assemblies containing digital signals by conducting in-circuit tests embodying the application of uninterrupted sequences of signals to nodes of the circuits and the comparison of nodal signals to expected values, reducing the complex testing of the circuit assemblies to a series of simple tests of components or groups of components constituting the assemblies; and, in connection with bus-structured circuits, eliminating the possibility of bus contention problems in good circuit assemblies under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.