X-ray powder diffractometer
US4274000A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 16, 1980 |
| Grant date | Jun 16, 1981 |
| Priority date | — |
| Expiry date | Jan 16, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray powder diffractometer functioning as a goniometer is disclosed wherein a monochromatic X-ray source is provided together with a sample to be analyzed and a detector means with position sensitive behavior. A transport system for digitally controllable advance drive is provided so as to advance the detector along an arc suited for a Guinier method for transmission and/or back reflection beam direction. An electronic analysis system is provided for preparing an intensity diagram of a local distribution of diffracted radiation for a given position location 2.theta. of the detector. The analysis system includes an amplifier/discriminator for delivering a time signal corresponding to the position/location of a respective single photon event received from the detector. A time-digital converter connected to the amplifier/discriminator is also provided together with a multichannel analyzer connected to the time-to-digital converter by a digital adder. The position-sensitive detector is located diametrically opposite the sample on the Guinier circle so as to form an assembly. This assembly is rotated in the primary beam such that the primary beam always impinges on the sample, and t…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.