Patent · US Expired

Method of manufacturing semiconductor devices

US4292156A · kind A · utility

17Cited by
4References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 1979
Grant dateSep 29, 1981
Priority date
Expiry dateFeb 28, 1999

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/143
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing a semiconductor device which has a thick insulating layer on a region for isolating semiconductor circuit elements from one another on a semiconductor substrate. This region of the substrate is selectively etched by using an insulating layer to leave the unetched part of the substrate in a mesa like shape, then, an anti-oxidation masking layer is formed on the sides of the insulating layer and the sides of the mesa shaped part and, after that, the thick insulating layer is formed by an oxidation treatment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.