Patent · US Expired

Memory

US4298962A · kind A · utility

137Cited by
3References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 25, 1980
Grant dateNov 3, 1981
Priority date
Expiry dateJan 25, 2000

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/60
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A high-density of semiconductor device is disclosed, which comprises a semiconductor substrate of a first conductivity type, first and second semiconductor regions of a second conductivity provided in the semiconductor substrate, the first and second semiconductor regions defining a channel region therebetween at the surface of the substrate, an insulator film disposed on the channel region, a conductive layer formed on the insulator film, means for producing depletion layers from the first and second semiconductor regions in such a manner that the depletion layers contact with each other to isolate the channel region from the substrate, means for selectively feeding majority carriers of the substrate to the channel region at a density higher than that of the substrate, and a means for detecting the existence of the accumulation of the majority carriers in the channel region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.