X-Ray diffractometer with high time resolution
US4301364A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 21, 1980 |
| Grant date | Nov 17, 1981 |
| Priority date | — |
| Expiry date | Feb 21, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray diffractometer is disclosed having a position-sensitive detector which is quasi-continuously movable in stepped fashion around a sample by a stepping motor. Output signals triggered by x-ray quanta are output from the position-sensitive detector and converted by an electronic evaluation unit into a time duration corresponding to a position of a particular x-ray quantum in the detector. The time-digital converter connected to the evaluation unit converts the time duration to a digital signal. A digital adder is provided having three inputs. The first input connects to an output of the time-digital converter, the second input connects to receive a digital value generated by a counter associated with the stepping motor, and a third input connects with a digital region selector. An output of the adder connects to a multi-channel analyzer having a plurality of regions therein for analyzing various desired measurement applications. The digital region selector addresses the appropriate region in the analyzer for a desired measurement application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.