Patent · US Expired

Test arrangement for the non-destructive testing of metallic test pieces

US4314203A · kind A · utility

12Cited by
5References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 9, 1979
Grant dateFeb 2, 1982
Priority date
Expiry dateApr 9, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N19/08
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test arrangement for non-destructive defect testing of metallic test pieces includes test probes which contactingly move across the surface of a test piece. Resilient members act on the testhead carrying the probes, one at each side of the testhead center of gravity, enabling the testhead to extend beyond the test piece edge while maintaining good contact between the probes and test piece. The testhead is adjustable with respect to the test piece surface and is maintained at a constant spacing from the test piece irrespective of test piece surface irregularities.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.