Patent · US Expired

Method of electrical short testing and the like

US4342959A · kind A · utility

11Cited by
5References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 29, 1981
Grant dateAug 3, 1982
Priority date
Expiry dateApr 29, 2001

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/52
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This disclosure is concerned with a process for connecting a short detector to electrical nodes in such apparatus as backplanes, cables, and circuit boards, before and after component assembly, to identify shorted node pairs in a substantially smaller number of tests than required by previously known methods, through a novel series of tests between each node and all other nodes, taken together, so as to identify shorted nodes, and then a series of tests between each of these shorted nodes and all other shorted nodes, taken individually, to identify the shorted node pairs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.