Aperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpieces
US4437000A · kind A · utility
0Cited by
5References
2Claims
0Family size
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Inventor
Key dates
| Filing date | Mar 20, 1981 |
| Grant date | Mar 13, 1984 |
| Priority date | — |
| Expiry date | Mar 20, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An aperture piece to be used in conjunction with backscatter instruments for measuring the thickness of a coating on a substrate of a concave workpiece. The aperture piece being selectively shaped so that a sample support surface, including an aperture through which radiation from a radioisotope is transmitted, may be inserted into the interior space defined by the concave workpiece to engage the concave surface. A method of calibrating backscatter instruments using the aperture piece to make correction for the failure to have a planar mating relation between the sample support surface and the concave workpiece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.