UPA Technology, Inc.
6Patents
0Active
6Granted
24Portfolio score
Filing activity: Jun 14, 1979 → Feb 24, 1986
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4245189A | Probe assembly for measuring conductivity of plated through holes | Physics | 19 | Expired |
| US4343092A | Probe guide and holder | Physics | 15 | Expired |
| US4860329A | X-ray fluorescence thickness measuring device | Physics | 9 | Expired |
| US4646341A | Calibration standard for X-ray fluorescence thickness | Physics | 6 | Expired |
| US4449048A | Workpiece positioning system for beta ray measuring instruments | Physics | 4 | Expired |
| US4437000A | Aperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpieces | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.