Crystal defects analyzer
US4448525A · kind A · utility
11Cited by
7References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 26, 1981 |
| Grant date | May 15, 1984 |
| Priority date | — |
| Expiry date | Jun 26, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0426
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A crystal defect analyzer comprises acousto-electric transducer means disposed in close adherence to a sample to be analyzed through the medium of a filter layer which functions to intercept light or electrons or particles emitted from said excitation means and to transmit only acoustic waves produced within said sample by excitation, thereby it can attain higher response and sensitivity, smaller size, higher resistance to vibration and superior operationality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.