Optical temperature measurement technique utilizing phosphors
US4448547A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 10, 1980 |
| Grant date | May 15, 1984 |
| Priority date | — |
| Expiry date | Jul 10, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/3213
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technique of temperature measurement wherein an object or environment to be measured is provided with a phosphor material layer that emits at least two optically isolatable wavelength ranges whose intensity ratio depends upon the object or environment temperature, the emitted radiation being brought to a detector by an optical system that may include an optical fiber. Several specific applications of this technique are disclosed, such as temperature monitoring of electrical equipment and industrial processing, medical temperature instrumentation including the use of disposable elements that contain a small quantity of the temperature dependent phosphor, special and multiple probes, the use of liquid phosphors, and a phosphor paint for monitoring surface temperatures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.