Workpiece positioning system for beta ray measuring instruments
US4449048A · kind A · utility
4Cited by
3References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 29, 1982 |
| Grant date | May 15, 1984 |
| Priority date | — |
| Expiry date | Sep 29, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A beta backscatter type of measuring instrument including a workpiece positioning system to permit precise prepositioning of the workpiece surface to be subjected to radiation preparatory to moving the radiation source into operative proximity therewith.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.