Patent · US Expired

Method of making semiconductor device

US4472239A · kind A · utility

92Cited by
12References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 8, 1983
Grant dateSep 18, 1984
Priority date
Expiry dateJul 8, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01F1/6845
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A semiconductor device comprising a semiconductor body having a depression formed into the first surface of the body. The device further comprises member means comprising a thermal-to-electric or static electric element, the member means having a predetermined configuration suspended over the depression. The member means is connected to the first surface at least at one location, the depression opening to the first surface around at least a portion of the predetermined configuration. The depression provides substantial physical and thermal isolation between the element and the semiconductor body. In this manner, an integrated semiconductor device provides an environment of substantial physical and thermal isolation between the element and the semiconductor body.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.