Patent · US Expired

Wafer handling apparatus and method

US4507078A · kind A · utility

35Cited by
4References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 1983
Grant dateMar 26, 1985
Priority date
Expiry dateMar 28, 2003

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/136
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A wafer handling method and apparatus insures proper centering of a wafer at a work station and controls the heat transferred to the wafer in a baking operation. The amount of heat transferred and the rate at which the heat is transferred to the wafer are regulated by controlling the distance between the wafer and a hot plate. The hot plate is maintained at a constant temperature higher than the bake out or equilibrium temperature to which the wafer is to be heated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.