Patent · US Expired

Static memory

US4507759A · kind A · utility

43Cited by
1References
18Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJan 28, 1982
Grant dateMar 26, 1985
Priority date
Expiry dateJan 28, 2002

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B10/15
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In a MOS static RAM, data lines disposed in a memory array and common data lines to be coupled with the data lines through a data line selection circuit are supplied with bias voltages of a level lower than a power source voltage level through bias MOSFETs. Normally, where the stand-by period of the RAM is long, the bias voltages of the data lines and the common data lines are abnormally raised by the leakage currents or tailing currents of the bias MOSFETs. As a result, the data read-out speed of the RAM is lowered. Such abnormal potential increases of the data lines and the common data lines are prevented by connecting resistance elements of comparatively high resistances (such as made of polycrystalline silicon layers), between the respective data lines and common data lines and the ground point of the circuitry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.