Patent · US Expired

Method for depositing polysilicon over TiO.sub.2

US4521446A · kind A · utility

7Cited by
4References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 1983
Grant dateJun 4, 1985
Priority date
Expiry dateNov 30, 2003

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/68
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Hydrogen annealing permits deposition of good quality polysilicon atop TiO.sub.2. Hydrogen annealing of TiO.sub.2 prevents the tremendous hydrogen affinity of as-deposited TiO.sub.2 from disrupting process reactions during deposition of polysilicon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.