Inventor · Fremont, CA, US

Chung S. Wang

10Patents
8h-index
10Co-inventors
65Inventor score

Filing activity: Nov 30, 1983 → Jun 6, 1995

Most-cited inventions

PatentTitleAreaCited byStatus
US5496751A Method of forming an ESD and hot carrier resistant integrated circuit structure Electricity 36 Expired
US5631485A ESD and hot carrier resistant integrated circuit structure Electricity 29 Expired
US5196357A Method of making extended polysilicon self-aligned gate overlapped lightly doped drain structure for submicron transistor Electricity 28 Expired
US5411906A Method of fabricating auxiliary gate lightly doped drain (AGLDD) structure with dielectric sidewalls Electricity 22 Expired
US5444003A Method and structure for creating a self-aligned bicmos-compatible bipolar transistor with a laterally graded emitter structure Electricity 18 Expired
US5227320A Method for producing gate overlapped lightly doped drain (GOLDD) structure for submicron transistor Electricity 17 Expired
US5340761A Self-aligned contacts with gate overlapped lightly doped drain (goldd) structure Electricity 16 Expired
US5288652A BICMOS-compatible method for creating a bipolar transistor with laterally graded emitter structure Emerging Cross-Sectional Technologies 14 Expired
US4521446A Method for depositing polysilicon over TiO.sub.2 Electricity 7 Expired
US4574177A Plasma etch method for TiO.sub.2 Emerging Cross-Sectional Technologies 4 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.