Patent · US Expired

Method for epitaxially growing Ge.sub.x Si.sub.1-x layers on Si utilizing molecular beam epitaxy

US4529455A · kind A · utility

48Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 1983
Grant dateJul 16, 1985
Priority date
Expiry dateOct 28, 2003

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/938
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A molecular beam epitaxy method of growing Ge.sub.x Si.sub.1-x films on silicon substrate is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.