Inventor · New Providence, NJ, US

John C. Bean

16Patents
11h-index
24Co-inventors
72Inventor score

Filing activity: Jun 5, 1980 → Sep 30, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US5091767A Article comprising a lattice-mismatched semiconductor heterostructure Electricity 122 Expired
US4681773A Apparatus for simultaneous molecular beam deposition on a plurality of substrates Emerging Cross-Sectional Technologies 52 Expired
US4529455A Method for epitaxially growing Ge.sub.x Si.sub.1-x layers on Si utilizing molecular beam epitaxy Emerging Cross-Sectional Technologies 48 Expired
US4772924A Device having strain induced region of altered bandgap Electricity 26 Expired
US5244749A Article comprising an epitaxial multilayer mirror Emerging Cross-Sectional Technologies 26 Expired
US4492971A Metal silicide-silicon heterostructures Electricity 24 Expired
US4554045A Method for producing metal silicide-silicon heterostructures Emerging Cross-Sectional Technologies 24 Expired
US4861393A Semiconductor heterostructures having Ge.sub.x Si.sub.1-x layers on Si utilizing molecular beam epitaxy Emerging Cross-Sectional Technologies 20 Expired
US4661829A Device using ordered semiconductor alloy Electricity 14 Expired
US5134090A Method of fabricating patterned epitaxial silicon films utilizing molecular beam epitaxy Emerging Cross-Sectional Technologies 13 Expired
US4514748A Germanium p-i-n photodetector on silicon substrate Electricity 12 Expired
US4725870A Silicon germanium photodetector Electricity 11 Expired
US4879256A Method of controlling the order-disorder state in a semiconductor device Electricity 9 Expired
US5096840A Method of making a polysilicon emitter bipolar transistor Emerging Cross-Sectional Technologies 3 Expired
US10297707B1 Thin film photovoltaic cell system and method of manufacture Emerging Cross-Sectional Technologies 3 Active
USRE33693E Device using ordered semiconductor alloy General 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.