Patent · US Expired

Memory through checking system with comparison of data word parity before and after ECC processing

US4531213A · kind A · utility

45Cited by
7References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 21, 1984
Grant dateJul 23, 1985
Priority date
Expiry dateAug 21, 2004

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2215
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

For use with a digital memory system that generates error correction code signals for storage with associated data words and for correction of detected error(s) in the associated data words when accessed, a system for through checking the accuracy of generation of the error correction codes and the decoding of error correction code is described. A data word parity signal is generated for storage with the associated data word and its associated check bit. When a data word is accessed, the read data word and its associated check bits are applied to error correction circuitry that results in a determination of whether or not any bits of the read data word are in error. Correction circuitry corrects those error in the read data word that are correctable. The corrected read data word is applied to a parity generator circuit that generates that parity of the corrected read data word. A comparison circuit compares the word parity calculated for the corrected read data word. Comparison indicates that the error correction system and through check system functioned properly, and failure of comparison indicates an error occurred in the throughput of the data word.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.