Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression
US4555783A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 30, 1982 |
| Grant date | Nov 26, 1985 |
| Priority date | — |
| Expiry date | Apr 30, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31915
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This disclosure is concerned with suppressing spurious signals generated during the in-circuit testing of circuit components, and which spurious signals may interfere with test signals being forced at selected nodes of the circuit that are inputs to components being tested and wherein such spurious signals may be routed via certain of the other circuit components, by automatically inhibiting either potential transmission of spurious signals by applying specific signals to components identified by analysis as normally feeding or processing input signals to the component(s) under test, or automatically inhibiting all inhibitable input parts of all components identified as those capable of passing such spurious signals to the input of the component(s) under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.