Optical phase measuring apparatus
US4583855A · kind A · utility
21Cited by
0References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 17, 1984 |
| Grant date | Apr 22, 1986 |
| Priority date | — |
| Expiry date | Feb 17, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2009/0261
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus is described for measuring spatial phase difference between a signal beam and a reference beam in substantially real time, where the signal and reference beams are coherent beams of optical radiation superimposed upon each other and having orthogonal polarization states with respect to each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.