Method of and apparatus for multiplexed automatic testing of electronic circuits and the like
US4620304A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 1985 |
| Grant date | Oct 28, 1986 |
| Priority date | — |
| Expiry date | Mar 13, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31926
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This disclosure is concerned with the automatic testing of electronic circuits and assemblies and the like containing large numbers of nodes, with reduced replications of test instruments and thus significantly reduced cost, through permitting a number of driver-sensors to be selectively switched to a larger number of nodes of the circuit being tested in accordance with a method of specifying and allocating the connections of the nodes of that circuit to the pins associated with each driver-sensor (or group thereof) that insures that no conflicts arise in connecting the driver-sensors to various groups of nodes for carrying out the desired tests.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.