Calibration standard for X-ray fluorescence thickness
US4646341A · kind A · utility
6Cited by
6References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 28, 1985 |
| Grant date | Feb 24, 1987 |
| Priority date | — |
| Expiry date | Mar 28, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Improved calibration standard construction for X-ray fluorescence thickness measurement gauges formed of one or more plated layers of known character and thickness disposed on an apertured supporting foil base and accessible to X-radiation through an aperture at the base of a conically shaped bore in a surrounding protective housing member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.