Patent · US Expired

Method of manufacturing an insulated gate field effect device

US4653173A · kind A · utility

4Cited by
16References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 4, 1985
Grant dateMar 31, 1987
Priority date
Expiry dateMar 4, 2005

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/60
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating insulated gate field effect transistors in NMOS or CMOS with source and drain regions having lightly doped extensions wherein the source and drain regions are made with a self-aligned process and a device made in accordance with such a method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.