Patent · US Expired

Electrical circuit test probe and connector

US4659987A · kind A · utility

25Cited by
27References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 1985
Grant dateApr 21, 1987
Priority date
Expiry dateMar 25, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06722
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improvement to electrical circuit test probes of the type wherein a socket tube having a cylindrical spring loaded plunger therein is mounted in a test fixture. Electrical contact is assured between the socket and the plunger as the plunger moves longitudinally by the plunger having a resiliently flexible wand extending inwardly therefrom at an angular offset to the longitudinal axis of the plunger and the wand terminating in a bulbous contact member. The contact member is disposed within a cylindrical plunger tube and passes through an opening through which the contact member cannot pass. As a result, the wand acts as a flexible resilient finger holding the contact member firmly against the inner wall of the plunger tube as the plunger is moved in and out through its limits of movement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.