QA Technology Company, Inc.
11Patents
2Active
11Granted
33Portfolio score
Filing activity: Mar 25, 1985 → Jul 16, 2014 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4597622A | Electrical connector for electrical circuit test probe and connector | Physics | 34 | Expired |
| US4885533A | Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region | Physics | 26 | Expired |
| US4659987A | Electrical circuit test probe and connector | Physics | 25 | Expired |
| US6570399B2 | Test probe and separable mating connector assembly | Physics | 18 | Expired |
| US5524466A | Method and apparatus for hydro-forming thin-walled workpieces | Performing Operations; Transporting | 15 | Expired |
| US7191518B2 | Method of making a hyperboloid electrical contact | Emerging Cross-Sectional Technologies | 15 | Expired |
| USD311346S | Electronic test probe | General | 12 | Expired |
| US6767260B2 | Hyperboloid electrical contact | Emerging Cross-Sectional Technologies | 8 | Expired |
| US6876530B2 | Test probe and connector | Physics | 5 | Expired |
| US7775841B2 | Hyperboloid electrical contact | Electricity | 4 | Active |
| US9490562B2 | Reduced diameter hyperboloid electrical contact | Emerging Cross-Sectional Technologies | 2 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.