Apparatus for measuring reflectivities of resonator facets of semiconductor laser
US4660983A · kind A · utility
7Cited by
1References
8Claims
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Assignee
Inventors
Key dates
| Filing date | Sep 18, 1985 |
| Grant date | Apr 28, 1987 |
| Priority date | — |
| Expiry date | Sep 18, 2005 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0683
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring the reflectivities of the resonator facets of a semiconductor laser when the facets are covered with a protective coating of dielectric material or the like, which comprises photodetector means for individually measuring the laser light powers from both facets of the resonator, reflector means for reflecting the laser light from one of the facets back to the laser, shutter means openable or closable at a position to block the laser light reflected from the reflector means, and photodetector means for measuring the power of the reflected laser light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.