Optical system for spectral analysis devices

US4690559A · kind A · utility

Assignee

• Jenoptik Jena GmbH · DE

Inventors

• Stefan Florek · Berlin, DE
• Helmut Becker-Ross · Berlin, DE
• Hans-Jürgen Dobschal · Kleinromstedt, DE
• Joachim Mohr · Jena, DE

Key dates

• Filing date: Jun 14, 1985
• Grant date: Sep 1, 1987
• Expiry date: Jun 14, 2005

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2003/1828
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.