Stefan Florek
14Patents
5h-index
15Co-inventors
63Inventor score
Filing activity: Jun 14, 1985 → Dec 13, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7876435B2 | Method for determining background and correction of broadband background | Physics | 28 | Active |
| US4690559A | Optical system for spectral analysis devices | Physics | 10 | Expired |
| US4940325A | Device for the investigation of highly resolved partial spectra of an echelle spectrum | Physics | 7 | Expired |
| US5448351A | Echelle polychromator | Physics | 7 | Expired |
| US5189486A | Echelle polychromator | Physics | 7 | Expired |
| US4856898A | Adjustable echelle spectrometer arrangement and method for its adjustment | Physics | 5 | Expired |
| US5182609A | Spectrometer | Physics | 5 | Expired |
| US7804593B2 | Echelle spectometer with improved use of the detector by means of two spectrometer arrangements | Physics | 4 | Active |
| US7215422B2 | Assembly and method for wavelength calibration in an echelle spectrometer | Physics | 3 | Expired |
| US7319519B2 | Method for the analysis of echelle spectra | Physics | 3 | Expired |
| US6717670B2 | High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile | Physics | 1 | Expired |
| US8681329B2 | Echelle spectrometer arrangement using internal predispersion | Physics | 0 | Active |
| US8102527B2 | Spectrometer assembly | Physics | 0 | Active |
| US8873048B2 | Spectrometer arrangement | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.