Patent · US Expired

Single transistor electrically programmable memory device and method

US4698787A · kind A · utility

309Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 21, 1984
Grant dateOct 6, 1987
Priority date
Expiry dateNov 21, 2004

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/693
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An electrically erasable programmable memory device which is programmable in the manner of an EPROM and erasable in the manner of an EEPROM. A dielectric layer between the control gate and the floating gate is provided having a high dielectric constant. A thin, uniform gate dielectric layer is provided which demonstrates minimal trapping. Finally, an asymmetrical source/drain junction is provided wherein the source includes a shallow portion and a deeper portion, which deeper portion defines the overlap between the source and the floating gate. In the preferred embodiment the dielectric between the control gate and the floating gate comprises tantalum pentoxide, the thin dielectric layer comprises oxynitride, and the deep diffusion portion of the source comprises phosphorous.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.