Patent · US Expired

Memory device with interconnected polysilicon layers and method for making

US4706102A · kind A · utility

6Cited by
8References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 7, 1985
Grant dateNov 10, 1987
Priority date
Expiry dateNov 7, 2005

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A memory device, based upon a field effect transistor having a floating gate is constructed for use in a silicon integrated circuit array of similar memory devices. The memory device includes only two polysilicon layers, a portion of each polysilicon layer being connected to each other through a via hole in an intervening silicon dioxide layer to form the floating gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.