Patent · US Expired

Monolithic semiconductor integrated circuit ferroelectric memory device, and methods of fabricating and utilizing same

US4707897A · kind A · utility

39Cited by
3References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 24, 1980
Grant dateNov 24, 1987
Priority date
Expiry dateMar 24, 2000

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/435
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A monolithic semiconductor integrated circuit-ferroelectric device is disclosed together with the method of manufacturing same. The ferrelectric device preferably consists of a layer of stable ferroelectric potassium nitrate disposed between electrical contacts positioned on opposite surfaces of the ferroelectric layer. The ferroelectric layer has a thickness of less than 110 microns, and preferably falling within a range of from 100 Angstrom units to 5,000 Angstrom units. The process of manufacturing the monolithic structure is multi-stepped and is particularly adapted for fabricating a potassium nitrate ferroelectric memory on a semiconductor integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.