Patent · US Expired

Position detection apparatus

US4710026A · kind A · utility

89Cited by
1References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 18, 1986
Grant dateDec 1, 1987
Priority date
Expiry dateMar 18, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/7049
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An apparatus includes a means for providing a predetermined frequency difference between two light beams and generating an optical beat with respect to interference between first and second diffracted light beams from a diffraction grating formed on a substrate, and a means for detecting a phase difference between the optical beat and a reference signal having a frequency corresponding to the frequency difference between the two light beams, and detects a position of the substrate based upon the phase difference in accordance with an optical heterodyne interference method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.