Patent · US Expired

Combined integrated circuit/ferroelectric memory device, and ion beam methods of constructing same

US4713157A · kind A · utility

17Cited by
9References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 14, 1985
Grant dateDec 15, 1987
Priority date
Expiry dateMay 14, 2005

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B53/00
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Methods for forming targets of ferroelectric, metal nitrate or similar material, methods for depositing such materials using ion beam techniques, and a method for forming a combined and integrated circuit/ferroelectric memory device wherein the ferroelectric material is deposited using ion beam techniques.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.