Patent · US Expired

Local interconnect

US4746219A · kind A · utility

60Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 12, 1986
Grant dateMay 24, 1988
Priority date
Expiry dateNov 12, 2006

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A local interconnect system for VLSI integrated circuits. After titanium is deposited for self-aligned silicidation of exposed moat and gate regions in a nitrogen atmosphere, a hardmask is deposited and patterned over the titanium. When a conductive titanium nitride layer is formed overall, it will already be patterned according to this hardmask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.