Method for making bipolar transistors using rapid thermal annealing
US4755487A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 1986 |
| Grant date | Jul 5, 1988 |
| Priority date | — |
| Expiry date | Sep 8, 2006 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S148/09
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
In making bipolar transistors, an interfacial oxide layer (5) is formed over ther monocrystalline region (1), and polysilicon (6) is formed both thereon as an extrinsic emitter region. After doping the polysilicon a monocrystalline emitter region (4) is produced in the base region by diffusion from the extrinsic polysilicon emitter region. The oxide layer (5) acts as a diffusion barrier to ensure that excessive dopant does not reach the monocrystalline region. After the above operation, a thermal treatment is effected at a higher temperature, e.g. 1100.degree. C., for a few seconds, which breaks down the interfacial oxide layer referred to above. This temporary use of the interfacial oxide layer leads to better and more consistant transistor characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.