Contact probe devices and method
US4783624A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 14, 1986 |
| Grant date | Nov 8, 1988 |
| Priority date | — |
| Expiry date | Apr 14, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07371
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Electrical contact probes for use in providing electrical contact between diagnostic equipment and an electrical device to be tested are provided. The probes disclosed herein are particularly suitable for use where contact sites are spaced relatively close together. A structure is disclosed, usable for a plurality of probe designs, including two-component and three-component contact probes, which enables the probes to be mounted by a variety of methods. Generally, the methods of mounting disclosed are enabled by the positioning of a mounting flare on the contact probes. Also shown is a three-component contact probe design that is particularly suited for use in long stroke applications, wherein the contact probe generally comprises an outer cylinder member, an internally received barrel, and a movable probe member. This latter member includes a relatively narrow shaft portion which slidably engages the barrel member, within the cylinder member. The long stroke contact probe further includes a relatively wide head portion, wider than an internal portion of the barrel, but narrower than an internal portion of the cylinder member, providing extra width and strength to the probe member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.