Interconnect Devices, Inc.
28Patents
15Active
28Granted
39Portfolio score
Filing activity: Apr 14, 1986 → Jun 22, 2015 · 9 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5204615A | Module attachment for printed circuit board test fixtures | Physics | 69 | Expired |
| US5175493A | Shielded electrical contact spring probe assembly | Physics | 40 | Expired |
| US6506082B1 | Electrical contact interface | Electricity | 39 | Expired |
| US5009613A | Spring contact twister probe for testing electrical printed circuit boards | Physics | 32 | Expired |
| US4783624A | Contact probe devices and method | Physics | 26 | Expired |
| US6696850B1 | Contact probe with off-centered back-drilled aperture | Physics | 23 | Expired |
| US7154286B1 | Dual tapered spring probe | Electricity | 23 | Expired |
| US6104205A | Probe with tab retainer | Electricity | 19 | Expired |
| US5225773A | Switch probe | Physics | 17 | Expired |
| US7798867B2 | Environmentally sealed contact | Electricity | 11 | Active |
| US8506307B2 | Electrical connector with embedded shell layer | Emerging Cross-Sectional Technologies | 10 | Active |
| US5484306A | Quick-connect terminal and receptacle | Electricity | 10 | Expired |
| US7298153B2 | Eccentric offset Kelvin probe | Physics | 9 | Expired |
| US7148713B1 | Algoristic spring as probe | Physics | 7 | Expired |
| US7362118B2 | Probe with contact ring | Physics | 7 | Active |
| US8758066B2 | Electrical connector with insulation member | Emerging Cross-Sectional Technologies | 6 | Active |
| US4846739A | Gas impervious crimp connection | Emerging Cross-Sectional Technologies | 6 | Expired |
| US7728611B1 | Compressive conductors for semiconductor testing | Physics | 4 | Active |
| US7581962B2 | Adjustable test socket | Physics | 3 | Active |
| US7701200B1 | Active test socket | Physics | 2 | Active |
| US9437954B2 | Series connector | Electricity | 2 | Active |
| US8575953B2 | Interconnect system | Physics | 2 | Active |
| US8278955B2 | Test interconnect | Emerging Cross-Sectional Technologies | 1 | Active |
| US9209548B2 | Electrical probe with rotatable plunger | Emerging Cross-Sectional Technologies | 1 | Active |
| US7498826B2 | Probe array wafer | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.