Patent · US Expired

Semiconductor devices and a process for producing the same

US4792841A · kind A · utility

14Cited by
7References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 24, 1984
Grant dateDec 20, 1988
Priority date
Expiry dateJul 24, 2004

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/903
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed is an MOSIC including a plurality of silicon gate type MOSFET's in which, after the polycrystalline silicon wirings are formed simultaneously with polycrystalline silicon gates, electrodes contacted with the source and drain regions are made of polycrystalline silicon so as to be connected to the polycrystalline silicon wirings, thereby to prevent the shallow pn junctions of the source and drain regions from being destroyed by the contacts and to provide a high degree of integration to one silicon chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.