Patent · US Expired

Rapid thermal CVD apparatus

US4796562A · kind A · utility

74Cited by
44References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 15, 1987
Grant dateJan 10, 1989
Priority date
Expiry dateJan 15, 2007

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/54
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

In a chemical vapor deposition apparatus for coating semiconductor wafers, the wafer is held face down in the reaction chamber. A radiant heat source above the wafer and outside the reaction chamber. The wafer is held on a ring chuck by means of a retractable clamp heats the wafer from its backside to a temperature in excess of 1000.degree. C. rapidly. The radiant heat source includes cylindrical lamps placed in a radial pattern to improve heating uniformity. In the selective tungsten process the temperature of the wafer is raised from ambient to about 600.degree. C. while flowing process gases. At the upper temperature range the heating source can be rapidly cycled on and off to improve the uniformity of coating.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.