Inventor · Livermore, CA, US

Daniel L. Brors

18Patents
12h-index
12Co-inventors
75Inventor score

Filing activity: Oct 8, 1975 → Sep 10, 2001

Most-cited inventions

PatentTitleAreaCited byStatus
US6321680A Vertical plasma enhanced process apparatus and method Electricity 467 Expired
US4565157A Method and apparatus for deposition of tungsten silicides Chemistry; Metallurgy 81 Expired
US5551985A Method and apparatus for cold wall chemical vapor deposition Chemistry; Metallurgy 80 Expired
US4629635A Process for depositing a low resistivity tungsten silicon composite film on a substrate Emerging Cross-Sectional Technologies 79 Expired
US4796562A Rapid thermal CVD apparatus Chemistry; Metallurgy 74 Expired
US4169031A Magnetron sputter cathode assembly Electricity 46 Expired
US6352594B2 Method and apparatus for improved chemical vapor deposition processes using tunable temperature controlled gas injectors Electricity 44 Expired
US6352593B1 Mini-batch process chamber Electricity 43 Expired
US4851295A Low resistivity tungsten silicon composite film Emerging Cross-Sectional Technologies 42 Expired
US4012766A Semiconductor package and method of manufacture thereof Emerging Cross-Sectional Technologies 29 Expired
USRE36957E Method and apparatus for cold wall chemical vapor deposition General 17 Expired
US6287635A High rate silicon deposition method at low pressures Electricity 17 Expired
US6506691B2 High rate silicon nitride deposition method at low pressures Electricity 11 Expired
US5291030A Optoelectronic detector for chemical reactions Physics 10 Expired
US4539278A Mask structure for X-ray lithography and method for making same Emerging Cross-Sectional Technologies 9 Expired
US4920908A Method and apparatus for deposition of tungsten silicides Chemistry; Metallurgy 8 Expired
US6780464B2 Thermal gradient enhanced CVD deposition at low pressure Electricity 4 Expired
US6235652A High rate silicon dioxide deposition at low pressures Electricity 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.