Apparatus for testing light-emitting devices using probe means having a preselected pattern arrangement
US4808815A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 23, 1987 |
| Grant date | Feb 28, 1989 |
| Priority date | — |
| Expiry date | Mar 23, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2635
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe is disclosed which may be used to test the optical functions of a wide variety of light-emitting devices or displays. The probe comprises a fiber optic cable and a detector. When the probe is placed in close proximity to a light source, the detector produces an electrical output signal whose magnitude is indicative of the intensity of the light conducted by the fiber optic cable. The output signal is electrically compatible with conventional automatic test equipment inputs. As a result, a plurality of probes may be arranged in a test fixture which may be connected directly to an automatic test unit, thereby permitting the automatic testing of the optical functions of a device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.