Patent · US Expired

Direct imaging monochromatic electron microscope

US4810880A · kind A · utility

21Cited by
9References
5Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 5, 1987
Grant dateMar 7, 1989
Priority date
Expiry dateJun 5, 2007

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/26
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A direct-imaging, monochromatic electron microscope includes an objective lens for collecting a substantial portion of emitted electrons from an area across a sample surface, a first transfer lens for collimating the electrons into beams, an energy filter receptive of the beams to transit monochromatic beams, and a second transfer lens receptive of the monochromatic beams for refocusing the same through a projection lens to effect an image of the plurality of spots in a projection plane. The objective lens is formed of a magnetic toroidal coil having a central hole therein with a dish-shaped magnetically permeable member cupped coaxially over the toroidal coil. The permeable member has a neck portion protruding through the central hole. The sample surface is interposed proximate the objective lens between the objective lens and the energy filter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.