Automatic circuit tester control system
US4816750A · kind A · utility
23Cited by
1References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 16, 1987 |
| Grant date | Mar 28, 1989 |
| Priority date | — |
| Expiry date | Jan 16, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31935
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for providing high speed control of digital test patterns and analog instruments in automatic circuit testing apparatus including a sequence controller including a random access memory ("RAM") for microcode and an address generator for selectively addressing instructions in said random access memory, a sequence address bus connected to the address generator of the sequence controller, digital test pattern RAM connected to the sequence address bus, and analog instruments including associated RAM loaded with microcode for the instruments and connected to the sequence address bus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.