Ernest P. Walker
17Patents
7h-index
13Co-inventors
63Inventor score
Filing activity: Jan 16, 1987 → May 18, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4816750A | Automatic circuit tester control system | Physics | 23 | Expired |
| US6049901A | Test system for integrated circuits using a single memory for both the parallel and scan modes of testing | Physics | 17 | Expired |
| US7256600B2 | Method and system for testing semiconductor devices | Physics | 15 | Expired |
| US6448575B1 | Temperature control structure | Electricity | 14 | Expired |
| US5657486A | Automatic test equipment with pipelined sequencer | Physics | 13 | Expired |
| US6374379B1 | Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment | Physics | 9 | Expired |
| US7023366B1 | Using a parametric measurement unit for converter testing | Electricity | 8 | Expired |
| US7403030B2 | Using parametric measurement units as a source of power for a device under test | Physics | 7 | Expired |
| US7574632B2 | Strobe technique for time stamping a digital signal | Physics | 6 | Active |
| US7102375B2 | Pin electronics with high voltage functionality | Physics | 6 | Expired |
| US7573957B2 | Strobe technique for recovering a clock in a digital signal | Physics | 5 | Active |
| US6282682A | Automatic test equipment using sigma delta modulation to create reference levels | Physics | 5 | Expired |
| US7856578B2 | Strobe technique for test of digital signal timing | Physics | 4 | Active |
| US7508228B2 | Method and system for monitoring test signals for semiconductor devices | Physics | 3 | Expired |
| US7135881B2 | Method and system for producing signals to test semiconductor devices | Physics | 2 | Expired |
| US7271610B2 | Using a parametric measurement unit to sense a voltage at a device under test | Physics | 2 | Expired |
| US7991046B2 | Calibrating jitter | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.