Method for testing conductor networks
US4841242A · kind A · utility
8Cited by
4References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 29, 1988 |
| Grant date | Jun 20, 1989 |
| Priority date | — |
| Expiry date | Feb 29, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing conductor networks on printed circuit boards and wiring modules comprising charging various points on the conductor network with one or more charging beams while simultaneously irridating the conductor network with a large area holding beam which compensates for charge losses during the charge detecting period which determines whether shorts or open circuits occur in the network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.