Matthias Brunner
43Patents
12h-index
45Co-inventors
81Inventor score
Filing activity: Dec 27, 1985 → May 31, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4985681A | Particle beam measuring method for non-contact testing of interconnect networks | Physics | 33 | Expired |
| US5268638A | "Method for particle beam testing of substrates for liquid crystal displays ""LCD""" | Physics | 22 | Expired |
| US5371459A | Method for particle beam testing of substrates for liquid crystal displays using parasitic currents | Physics | 22 | Expired |
| US6465795B1 | Charge neutralization of electron beam systems | Electricity | 22 | Expired |
| US7319335B2 | Configurable prober for TFT LCD array testing | Physics | 20 | Expired |
| US4954705A | Method for examining a specimen in a particle beam instrument | Electricity | 20 | Expired |
| US5834773A | Method and apparatus for testing the function of microstructure elements | Physics | 19 | Expired |
| US5258706A | Method for the recognition of testing errors in the test of microwirings | Physics | 19 | Expired |
| US4983833A | Device for the detecting of charged secondary particles | Electricity | 19 | Expired |
| US5414374A | Method for particle beam testing of substrates for liquid crystal displays (LCD) | Physics | 18 | Expired |
| US6730906B2 | Method and apparatus for testing a substrate | Electricity | 14 | Expired |
| US4831267A | Detector for charged particles | Electricity | 12 | Expired |
| US7129694B2 | Large substrate test system | Physics | 9 | Expired |
| US5190672A | Method for thermal disposal of sewage sludge | Emerging Cross-Sectional Technologies | 9 | Expired |
| US4841242A | Method for testing conductor networks | Physics | 8 | Expired |
| US4748407A | Method and apparatus for measuring time dependent signals with a particle probe | Physics | 8 | Expired |
| US7355418B2 | Configurable prober for TFT LCD array test | Physics | 7 | Expired |
| US7372250B2 | Methods and apparatus for determining a position of a substrate relative to a support stage | Physics | 6 | Expired |
| US8115506B2 | Localization of driver failures within liquid crystal displays | Physics | 5 | Active |
| US8220825B2 | Method and device for fastening an airbag in a motor vehicle | Emerging Cross-Sectional Technologies | 5 | Active |
| US7075323B2 | Large substrate test system | Electricity | 4 | Expired |
| US7746088B2 | In-line electron beam test system | Electricity | 3 | Active |
| US7535238B2 | In-line electron beam test system | Electricity | 3 | Expired |
| US7317325B2 | Line short localization in LCD pixel arrays | Physics | 3 | Expired |
| US5373233A | Method for the recognition of testing errors in the test of microwirings | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.